New method enhances X-ray microscopy for detecting tiny defects X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult to detect small cracks or tiny inclusions in the images. Log in or register to post comments
X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult to detect small cracks or tiny inclusions in the images.